Veeco Dimension 3000 AFM

Veeco Dim 3000 AFM
The Veeco Dimension 3000 provides various modes of atomic force microscopy.

Overview

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension 3000 operates in both tapping and contact modes, with capabilities of topographic and phase imaging, lateral force microscopy, magnetic force microscopy, and adhesion force mapping. It is also used in measurements of surface and adhesion forces.

Reservations

Location

Room 616, M&M Research Building

Capabilities

The Veeco Dimension 3000 atomic force microscope (AFM) is used to analyze a variety of sample sizes and types. It can function in air or liquid, making it useful for biological studies. The sample is placed on a stage which moves in the x, y, and z directions via piezoelectric elements. A cantilever with a microscopic tip moves like a spring over the surface of the sample. A laser beam reflected off the end of the cantilever is recorded on photodiodes, producing an image of the surface topography. Cantilevers vary in size from 3-100 µm with tip radii of 10-30 nm. The size of the tip and flexibility of the cantilever contribute to the high resolution of the image, which can reach 10 pm. The operating modes of the AFM (contact, non-contact, and tapping) and lateral force microscopy allow the user to access a variety of functions of the microscope. In addition to imaging, the AFM can measure the strength of inter-atomic forces and can sense the presence of individual surface atoms.

Training

eTraining

Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Available topics related to this instrument:

Specimen Preparation Online Training Veeco Dimension 3000 Atomic Force Microscope Online Training User Support for Online Training

Resources

Last updated March 27, 2014