The Applied Chemical and Morphological Analysis Laboratory (ACMAL) is a university facility which is part of the Materials Characterization & Fabrication Facilities. ACMAL houses an extensive array of electron microanalytical and X-ray instruments. ACMAL is managed by the Department of Materials Science and Engineering.
The Electron Optics Facility includes two scanning electron microscopes (SEM), a high-resolution transmission electron microscope (TEM) and a focused ion beam milling system (FIB).
The X-ray Facility includes an energy dispersive X-ray fluorescence spectrometer and five X-ray diffractometers.
The Scanning Probe Microscopy Facility contains an atomic force microscope (AFM).
The Surface Analysis Facility utilizes a scanning Auger microprobe for Auger electron spectroscopy (AES).
The Fluorescence Optical Microscopy Facility includes two optical microscopes and digital cameras.