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Featured Image: The ACMAL eTraining module "Hitachi S-4700 FE-SEM" contains a new section on Microanalysis, including X-Ray Spectral Analysis and X-Ray Mapping. Procedures includes steps for using the 4pi Revolution® software for Mac.
ELECTRON OPTICS & X-RAY FACILITIES
The Applied Chemical and Morphological Analysis Laboratory (ACMAL) is a university facility which is part of the Materials Characterization & Fabrication Facilities. ACMAL houses an extensive array of electron microanalytical and X-ray instruments. ACMAL is managed by the Department of Materials Science and Engineering.
The Electron Optics Facility includes two scanning electron microscopes (SEM), a high-resolution transmission electron microscope (TEM) and a focused ion beam milling system (FIB).
The X-ray Facility includes a sequential X-ray fluorescence spectrometer and five X-ray diffractometers.
The Scanning Probe Microscopy Facility contains an atomic force microscope (AFM).
The Surface Analysis Facility utilizes a scanning Auger microprobe for Auger electron spectroscopy (AES).
LOCATION
Sixth Floor, M&M Research Building
About the Spinning Graphic: The ACMAL graphic features an electron diffraction pattern, a Bragg diagram, an X-ray spectrum, a powder diffraction pattern, a lattice, and a photon. Roll your mouse over the graphic to pause it. The latest Flash plug-in is recommended though not required for this website. This site powered by Adobe Creative Suite 3, Brown Bear Calcium Web Calendar Hosting Service, and Swift 3D 5.0. Search powered by 
Last updated
November 16, 2009
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