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Featured Image: The Scanning Probe or Atomic Force Microscopy lab now has a logbook for recording usage of cantilever tips. Scanning Probe Microscopy and Surface Analysis are the latest facilities to join ACMAL.
ELECTRON OPTICS & X-RAY FACILITIES
The Applied Chemical and Morphological Analysis Laboratory (ACMAL) is a university facility which is part of the Materials Characterization & Fabrication Facilities. ACMAL houses an extensive array of electron microanalytical and X-ray instruments. ACMAL is managed by the Department of Materials Science and Engineering.
The Electron Optics Facility includes two scanning electron microscopes (SEM), a high-resolution transmission electron microscope (TEM) and a focused ion beam milling system (FIB).
The X-ray Facility includes a sequential X-ray fluorescence spectrometer and five X-ray diffractometers.
LOCATION
Sixth Floor, M&M Research Building
About the Spinning Graphic: The ACMAL graphic features an electron diffraction pattern, a Bragg diagram, an X-ray spectrum, a powder diffraction pattern, a lattice, and a photon. Roll your mouse over the graphic to pause it. The latest Flash plug-in is recommended though not required for this website. This site powered by Adobe Creative Suite 3, and Swift3D 5.0. Search powered by 
Last updated
July 21, 2008
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