eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

Hitachi FB-2000A FIB

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Powders

Lofting

Procedure by NIST scientist Scott Wight. Click to enlarge images.

We have successfully used a technique introduced by NIST, the National Institute of Standards and Technology. In this procedure, a small volume of powder is placed to one side in a wide mouth jar. A carbon tape covered SEM mount is placed beside the powder, and the jar is sealed. A puff of air from a laboratory duster is blown through a small hole in the lid above the powder. The particles are lofted inside the jar and drift down onto the SEM mount. Insofar as we can tell, the result is a well-distributed cross-section of particle sizes. There are, of course, many particles that touch, and ultra fine particles coat larger particles to some extent.

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