eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

Hitachi FB-2000A FIB

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Powders

Introduction

Powders and particles are often examined with SEM techniques. What follows are descriptions of the most common ways to handle these types of materials.

Powder or particles may be poured onto a specimen mount. We refer to this method as dumping. This is a simple procedure, but it leads to agglomeration of the powder due to static attraction. An ill effect of pouring the specimen onto a mount is that particles pile atop one another. Piled particles do not form a mechanical bond to each other and conductivity of the particles is lost, leading to specimen charging.

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