eTraining Introduction

Specimen Preparation

Leica Ultracut UCT



Hitachi S-4700 FE-SEM

Hitachi FB-2000A FIB


Veeco Dim 3000 AFM

Fluorescence Microscopes



Locate Tip Icon1. Locate the cantilever by selecting the Locate Tip icon. Adjust the knobs on the camera part of the microscope until the end of the cantilever is in the cross-hairs on the JVC monitor. VIEW
2. Focus the image by holding down the focus button on the trackball and sliding the trackball. It may not be possible to focus the entire cantilever; make sure the end of the cantilever is in focus. NOTE: To use the trackball, the Locate Tip menu must be open! VIEW
3. Click OK to store the position in the software. VIEW
4. Align the laser onto the end of the cantilever using the two knobs on top of the AFM head. For a single beam cantilever, the sum signal maximum should be 2-4 for Tapping mode and ~4 for Contact mode. See Tapping Mode Laser Alignment in Atomic Force Microscopy. VIEW
5. Adjust the laser spot on the photodiode using the two knobs located on the side of the AFM head. For Tapping mode, the red dot on the right-most monitor should be centered in the crosshairs with a vertical displacement within ±0.1 V. For Contact Mode, the red dot should be centered laterally (±0.1 V) and with a vertical displacement of ~-2 V (between -1 V and -4 V). VIEW
Autotune Icon6. If using Tapping Mode, select the Autotune icon and then click on the Autotune button. The chart produced should look like the bottom image in VIEW. If not, re-do the alignments and check the Autotune again. VIEW
Return to Image Icon7. Once the Autotune is completed, select the Go Back to Image Mode icon.
8. Check to make sure the RMS (root mean square) value displayed on the right monitor is between 1.9 and 2.1. VIEW

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