X-Ray Facility Overview

X-ray powder diffraction (XRD) is a powerful structural characterization tool that is essentially a two point probe which measures the distance between all pairs of atoms within the diffraction volume. As a result, the information gained is dependent only on your creative knowledge of diffraction and ability to mathematically extract the information from the data. There are several well established XRD analysis techniques provided with the instrument analysis and data acquisition software; in addition, the facility has developed several in-house software programs along with a variety of stand-alone XRD related software programs. With over 20 years of experience in teaching, training, data acquisition, and data analysis, in the field of XRD on a wide variety of samples, including unconventional diffraction samples, please consult with Edward Laitila to learn more on how this facility may enhance your research.

X-ray fluorescence (XRF) wavelength spectroscopy provides elemental analysis of materials in solid, powder, or liquid form. The 9400 sequential spectrometer is capable of analyzing all elements from boron thorough uranium. Detection limits can be in the parts per million range with easy identification of elements present; particularly useful for identifying unexpected elements. UniQuant analysis provided quick quantification of elements particularly useful for material development, externally provided samples, and combined with XRD enhances identification of phases present in a material.

LOCATION

Sixth Floor, M&M Research Building

First Floor, M&M Undergraduate Building