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Bragg Diagram
  • Owen P. Mills
  • Electron Optics Engineer
  • Materials Science & Engineering
  • Michigan Technological University
  • Room 512, M&M Building
  • Houghton, MI 49931
  • PH 906.369.1875
  • FAX 906.487.2934
  • opmills@mtu.edu

X-Ray Facility
The X-Ray Facility houses five X-ray diffraction and fluorescence instruments.

X-Ray Facility Capabilities

X-Ray Diffraction (XRD) Capabilities

  • Development of Customized Data Collection and Analysis
  • Phase Analysis
  • Lattice Parameter Determination
  • Percent Crystallinity
  • Quantitative Analysis
  • Crystallite (Particle) Size and Strain Analysis
  • Residual Stress
  • Texture
  • Laue Photographs
  • A Variety of Other Techniques Available Upon Request

Ancillary Equipment

  • Zero Background Sample Holder
  • Custom Powder Sample Holders
  • Custom Irregular Shaped Solid Holder
  • Custom Liquid Holder
  • ICDD-JCPDS database
  • Anton-Paar High Temperature Stage


X-ray Fluorescence Spectrometry (XRF) Capabilities

  • Bulk elemental analysis capable of detecting boron to uranium.
  • Eight analyzing crystals, with a specialized crystal for carbon analysis.
  • Three fundamental modes of operation, qualitative scans to determine elements present, classical quantitative analysis for precise quantification (requires standards), and standardless quantitative analysis.
  • UniQuant quantitative analysis software available which can determine elements from fluorine to uranium in 17 minutes.
    • Requires no standards particularly useful if standards are not available e.g. material development.
    • Irregularly shaped samples can be accommodated.
  • Helium flush system allows the ability to do loose powders and liquids for all methods of analysis.
  • Capable of detection and quantification in the parts per million (ppm) range.

Ancillary Equipment

  • Angstrom Press
  • Mettler High Precision Scale
  • SPEX Mill
  • Liquid Sample Cells