Siemens D500 Powder

Siemens D500 Powder
The Siemens D500 Powder Diffractometer is used to identify crystalline compounds by matching diffraction patterns to a database.


X-Ray Diffraction

The Siemens D500 powder diffractometer is configured with an graphite monochrometer and IBM compatible workstation. This system is primarily used to satisy the needs of undergraduate research needs and is housed in that building.



Room 104, M&M Undergraduate Building


This theta-theta configured goniometer permits automated collection of intensity vs. scattering angle scans. Data reduction schemes include unit cell determination, pattern indexing, precision lattice parameter determination. Crystalline compounds can be identified through indexing with the builtin JCPDS powder diffraction database.


X-Ray Diffraction Users Group Learn X-Ray Diffraction Science


MY 3200 – Materials Characterization I
Fundamentals of microstructural and chemical characterization of materials. Examines the physical principles controlling the various basic characterization techniques. Topics include crystallography, optics, optical and electron microscopy, and diffraction. Laboratory focuses on proper operational principles of characterization equipment, which includes optical and other microscopy methods and various diffraction techniques.
Credits: 4.0
Lec-Rec-Lab: (2-1-3)
Semesters Offered: Fall
Pre-Requisite(s): MY 2100 and MY 2110


Last updated May 10, 2012