Philips Electronic Instruments X-Ray Generator

Philips Laue
The Philips Laue methods are used to determine single crystal orientation and symmetry.

Overview

X-Ray Diffraction

The Philips Electronic Instruments X-ray generator provides an X-ray source for the Laue method X-ray photo measurement. The system has been upgraded with a modern and complete safety interlocked, leaded enclosure.

Reservations

Location

Room 630, M&M Research Building

Capabilities

The Laue method utilizes a beam of coherent radiation focused on a fixed single crystal. When the Bragg angle θ is fixed for every set of planes in the crystal, and each set picks out and diffracts that particular wavelength which satisfies the Bragg law for the particular values of the lattice distance d and the diffraction angle θ involved. This Laue photo camera makes use of the back-reflection Laue method. In this case the film is placed between the crystal and the X-ray source, with the incident beam passing through a hole in the film, and the diffracted beams passing in a backward direction are recorded. The diffracted beams form an array of spots on the film. The positions of the spots on the film depend on the orientation of the crystal relative to the incident beam. The Laue methods are used to determine the crystal orientation and crystal symmetry.

Training

Resources

Last updated May 10, 2012