X-Ray Facility

X-Ray Facility Overview

X-ray Powder Diffraction
X-ray Powder Diffraction

X-ray powder diffraction (XRD) is a powerful structural characterization tool that is essentially a two point probe which measures the distance between all pairs of atoms within the diffraction volume. As a result, the information gained is dependent only on your creative knowledge of diffraction and ability to mathematically extract the information from the data. There are several well established XRD analysis techniques provided with the instrument analysis and data acquisition software; in addition, the facility has developed several in-house software programs along with a variety of stand-alone XRD related software programs. With over 20 years of experience in teaching, training, data acquisition, and data analysis, in the field of XRD on a wide variety of samples, including unconventional diffraction samples, please consult with Edward Laitila to learn more on how this facility may enhance your research.

Scintag XDS-2000 Powder Scintag XDS-2000 PTS Philips Laue Siemens D500 Powder Xenemetrix EX-6600 EDS

X-ray fluorescence (XRF) wavelength spectroscopy provides elemental analysis of materials in solid, powder, or liquid form. The EX-6600 energy dispersive spectrometer is capable of analyzing all elements from fluorine thorough uranium. Detection limits can be in the parts per million range with easy identification of elements present. Standard-less analysis capability provides quick quantification of elements particularly useful for material development, externally provided samples, and combined with XRD enhances identification of phases present in a material.

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Location

Sixth Floor, M&M Research Building
First Floor, M&M Undergraduate Building

X-Ray Diffraction (XRD) Capabilities

Development of Customized Data Collection and Analysis
Phase Analysis
Lattice Parameter Determination
Percent Crystallinity
Quantitative Analysis
Crystallite (Particle) Size and Strain Analysis
Residual Stress
Texture
Laue Photographs
A Variety of Other Techniques Available Upon Request

Ancillary Equipment

Zero Background Sample Holder
Custom Powder Sample Holders
Custom Irregular Shaped Solid Holder
Custom Liquid Holder
ICDD-JCPDS database
Anton-Paar High Temperature Stage

X-ray Fluorescence Spectrometry (XRF) Capabilities

Update needed for 2010.

Bulk elemental analysis capable of detecting boron to uranium.
Eight analyzing crystals, with a specialized crystal for carbon analysis.
Three fundamental modes of operation, qualitative scans to determine elements present, classical quantitative analysis for precise quantification (requires standards), and standardless quantitative analysis.
UniQuant quantitative analysis software available which can determine elements from fluorine to uranium in 17 minutes.
Requires no standards particularly useful if standards are not available e.g. material development.
Irregularly shaped samples can be accommodated.
Helium flush system allows the ability to do loose powders and liquids for all methods of analysis.
Capable of detection and quantification in the parts per million (ppm) range.

Ancillary Equipment

Angstrom Press
Mettler High Precision Scale
SPEX Mill
Liquid Sample Cells