PHI 5800 X-ray Photoelectron Spectrometer

PHI 5800 XPS
The PHI 5800 XPS probes sample surfaces.


CH 5660/MY5660—Surface Science and Spectroscopy Course Syllabus
College of Science and Arts/College of Engineering
Fall 2017

The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including elemental mapping capabilities, an electron gun source for AES analysis, an ion sputter gun for depth profiling, and stage tilting for angle-resolved XPS.

The XPS was generously donated by the Army Research Laboratories with help from the Department of Chemistry at Michigan Tech.

SA Contact



Room 633, M&M Research Building



Michigan Tech offers many undergraduate and graduate courses related to materials characterization.

One of these relates to surface methods:

CH 5660/MY 5660 – Surface and Interface Science for Chemical and Materials

This course will cover the physical and chemical properties that govern surface
processes and appropriate analysis techniques used to characterize and analyze
interfaces and surface chemical reactions. Topics include principles of physical
chemistry and materials science for understanding and applying modern surface
Credits: 3.0
Lec-Rec-Lab: (3-0-0)
Semesters Offered: On Demand
Restrictions: Must be enrolled in one of the following College(s): Sch of Forest Res & Envir Sci, School of Technology, College of Engineering; May not be enrolled in one of the following Class(es): Freshman, Sophomore


Last updated August 29, 2017