Currently browsing tag


Hitachi S-4700 FE-SEM

FESEM update

September 19, 2018. The engineers think there is some contamination on a stationary aperture in the column. It will be a big job to change it and it couldn’t be done before next week at the earliest, more likely the week after. I found that the scope works fine at …


FESEM data bar on images

June 15, 2017. After 2 hours on the phone, the Hitachi engineer and I found out why the data bar was positioned so far into the images. Someone had changed a software setting – a box was checked that shouldn’t have been. Needless to say, he and I had other …


Changes to basic FESEM configuration

June 5, 2017. If you make any changes to the basic operational configuration of the FESEM software please return it to the original settings. Two things that seem to happen too frequently. One is changing the detector from Upper to Lower or Mixed. It should be left on Upper. The …


FESEM Software Issues

May 30, 2017. We’ve noticed that users seem to be having more problems with the FESEM when the software has been left open for extended periods of time. So we would now like you to close the SEM program after each use of the microscope until we can figure out …

TEM Viewport Cover

TEM camera

April 26, 2012. This is a repeat of an earlier message about the TEM camera. There are dust particles on the TEM camera element. This is impossible to prevent, but the software has been designed to “erase” the effects from images. This is accomplished by a calibration that I periodically …