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Cantilever Tip
  • Owen P. Mills
  • Electron Optics Engineer
  • Materials Science & Engineering
  • Michigan Technological University
  • Room 512, M&M Building
  • Houghton, MI 49931
  • PH 906.369.1875
  • FAX 906.487.2934
  • opmills@mtu.edu

Scanning Probe Microscopy
The Scanning Probe Microscope Facility houses two atomic force microscopes.

Force Calibration Plot

Scanning Probe Microscopy Overview

Two atomic force microscopes are available for scanning probe microscopy. The Scanning Probe Microscope (SPM) Facility is overseen by Mr. Owen Mills.

AFM CD Surface

Rotate the Sample Image

LOCATION

Sixth Floor, M&M Research Building

Image Above, Left: A graduate student examines a Force Calibration Plot within the SPM Lab.

Image Above, Right: AFM image of the surface of a compact disc. The sample size is 5 x 5 microns. Click the image to see the Flash animation.

Menu Image, Left: Cantilever tip from an atomic force microscope.

Last updated December 6, 2007