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  MCFF > ACMAL > X-Ray > Scintag XDS-2000 θ/θ
Lattice
  • Owen P. Mills
  • Electron Optics Engineer
  • Materials Science & Engineering
  • Michigan Technological University
  • Room 512, M&M Building
  • Houghton, MI 49931
  • PH 906.369.1875
  • FAX 906.487.2934
  • opmills@mtu.edu

X-Ray Facility
The Scintag XDS2000 Powder Diffractometer is used to identify crystalline
compounds by matching diffraction patterns to a database.

Scintag XDS2000 Powder Diffractometer

Calendar Scintag XDS-2000 θ/θ Reservations
Rates | Instructions | Calendar

Scintag XDS2000 Powder Diffractometer

X-Ray Diffraction

The Scintag XDS2000 powder diffractometer is configured with a graphite monochromoter and IBM compatible workstation running Scintag DMSNT software in Windows NT environment.

LOCATION

Room 629, M&M Research Building

CAPABILITIES

This theta-theta configured goniometer permits automated collection of intensity vs. scattering angle scans. Data reduction schemes include unit cell determination, pattern indexing, precision lattice parameter determination, and Reitveld analysis. Crystalline compounds can be identified through indexing with the builtin JCPDS powder diffraction database.

Last updated July 2, 2007