Veeco Nanoscope II AFM

Veeco Nanoscope II AFM
The Veeco Nanoscope II operates in contact mode of atomic force microscopy.

Overview

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in both gas and liquid environments.

Reservations

Location

Room 616, M&M Research Building

Training

eTraining

Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Available topics related to this instrument:

Specimen Preparation Online Training User Support for Online Training

Resources

Last updated March 27, 2014