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Electron Microscopy
Hitachi S-4700 FE-SEM
Hitachi FB-2000A FIB
JEOL JSM-6400 SEM
JEOL JEM-2010 TEM
FEI 200kV Titan Themis S-TEM
Philips XL 40 ESEM
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Scanning Probe Microscopy
Veeco Dimension 3000 AFM
MFP-3D Origin AFM
Surface Analysis
Perkin Elmer PHI-660 Scanning Auger Microscope
PHI 5800 X-ray Photoelectron Spectrometer
Fluorescence Optical Microscopy
Zeiss AxioVert FOM
Olympus BX51 FOM
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SPM Log Book and Cantilever 2
SPM Log Book and Cantilever 2
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Published on
January 16, 2013
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