Scanning Probe Microscopy

Scanning Probe Microscopy Overview

Two atomic force microscopes are available for scanning probe microscopy. The Scanning Probe Microscope (SPM) Facility is overseen by Mr. Owen Mills.

Veeco Dimension 3000 AFM Veeco Nanoscope II AFM

Policy

Cantilevers are located in a box in the AFM lab. There is a log sheet next to them. Facility users must record their use of tips.

SPM Contact SPM Status SPM Online Training

Location

Sixth Floor, M&M Research Building

SPM Log Book and Cantilevers 1
SPM Log Book and Cantilever 2
SPM Log Book and Cantilever 3