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- Owen P. Mills
- Electron Optics Engineer
- Materials Science & Engineering
- Michigan Technological University
- Room 512, M&M Building
- Houghton, MI 49931
- PH 906.369.1875
- FAX 906.487.2934
- opmills@mtu.edu
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Rates: December 1, 2007 - September 30, 2008LABORATORY or INSTRUMENT |
MTU Research (On Campus)1 |
Consulting (Off Campus) |
| w/o Operator | w/o Operator | |
| JEOL JSM-6400 SEM | $28/hr. | $84/hr. |
| Hitachi S-4700 FE-SEM | $30/hr. | $100/hr. |
| Hitachi FB-2000A FIB | $40/hr. | $130/hr. |
| JEOL JEM-4000FX TEM2 | $75/hr. | $150/hr. |
| Hummer 6.2 Sputter Coater (sample preparation rate) |
$8/hr. | $50/hr. |
| X-Ray Diffraction (XRD) | $5.50/hr. | $20/hr. |
| X-Ray Fluorescence (XRF) | $28/sample | $150/sample |
| + $10/standard calibration | + $20/standard calibration | |
| Atomic Force Microscope | $7.50/hr. | $110/hr. |
| Perkin Elmer PHI-660 Scanning Auger Microscope | $50/hr. | $150/hr. |
1If technical staff are used to operate equipment, staff hourly salary + associated fringe benefits will be charged to user research or incentive indexes.
2Due to the intrinsic time-consuming nature of using the 4000FX high resolution TEM, each user will incur a two (2) hour minimum charge per logbook entry.
