What else goes on in ACMAL? See Featured Image archive.

November 16, 2009: eTraining Update

ACMAL eTraining contains a new section on Microanalysis in the FE-SEM module.

August 16, 2009: eTraining Update

ACMAL eTraining contains a new section about Image Analysis Software.

August 15, 2009: eTraining Update

ACMAL eTraining contains a new module for the Veeco Dimension 3000 AFM.

July 2, 2009: eTraining Update

ACMAL eTraining contains a new module for the Leica Ultracut UCT.

June 26, 2009: MSDS Xchange

A new page on MSDS sheets is available for EOF users.

June 17, 2009: eTraining Update

ACMAL eTraining contains a new module for the Hitachi S-4700 FE-SEM.

May 6, 2009: AFM and SA Pages Updated

Poster images and Capabilities have been added to the Veeco Dimension 3000 Atomic Force Microscope page and to the Perkin Elmer PHI-660 Scanning Auger Microscope page.

March 19, 2009: Electron Microscopy Policies Updated

Electron Microscopy has updated policies, including repair charge assessments in the case of negligent equipment use. See EM Procedures and Policies.

The X-Ray Facility now has a Procedures and Policies page.

March 4, 2009: New XRD Procedures and Policies

The X-Ray Facility now has a Procedures and Policies page.

March 4, 2009: New XRD Education and User Group Pages

The X-Ray Facility now has an EDUCATION section composed of the new X-Ray Diffraction Users Group (XRDUG) page, the Learn X-Ray Diffraction Science page, and the XRD Resources link.

February 25, 2009: Rates Corrected

Please visit the ACMAL rates page to see corrections.

February 12, 2009: New Rates Listed

Please visit the ACMAL rates page to see the equipment use rates for October 1, 2008.

January 26, 2009: Description of Control Panels for JEOL JEM-4000FX TEM

TEM description of control panels document is linked from ACMAL eTraining as a rapid communication.

January 23, 2009: MSA and EFUG

Owen Mills recommends that Electron Optics Facility users consider joining the Microscopy Society of America listserver. FIB users may be interested in EFUG: European Focused Ion Beam Users Group.

January 23, 2009: XRD Users Organizational Meeting

XRD users and MY5260 students are encouraged to attend this meeting.

January 5, 2009: Tips for EDS Users

SEM EDS Tips for dQant32, dSspec, dPict32, and Spectrometer are linked from ACMAL eTraining as a rapid communication document.

December 31, 2008: FE-SEM, FIB and TEM Card Swipes are in Place

All SEM facility users must use the card swipe and automated logging system for the Hitachi S-4700 FE-SEM, Hitachi FB-2000A FIB and the JEOL JEM-4000FX TEM as of January 1, 2009. Card swipe access for the SEM has been in place since July 2008. Review the new ACCESS INSTRUCTIONS page. Each instrument in EOF, X-Ray Facility, SPM, and SA has an access type: card swipe or logbook.

December 9, 2008: Publication

The ACMAL eTraining group published in Microscopy and Microanalysis.

November 28, 2008: Innovative Solutions

Owen is a 2008 recipient of the Innovative Solutions Award, part of the "Staff Making a Difference Awards".

November 18, 2008: Tech Talks

Owen Mills and Sue Hill presented "Using Rich Content for Microscopy Training" to other faculty and staff at Michigan Tech.

October 31, 2008: eTraining Page Performance

The August 20, 2008 version of the ACMAL eTraining Module may have performance issues relating to how the content and styles load into the page frame. The solution is simply to click the topic title again within the Table of Contents. We are looking into this issue and apologize for any inconvenience.

October 13, 2008: EOF Supplies

Electron Optics Facility users should check the Electron Optics Facility Supplies page for updated vendor and item information.

September 29, 2008: Education: X-Ray Diffraction

The X-Ray Facility now presents many online resources for learning the basic science behind X-Ray diffraction and related topics.

August 29, 2008: SPM Calendars

The two AFM instruments now share a single calendar, as the resources in Scanning Probe Microscopy cannot be used simultaneously. The descriptions of the instruments have been updated.

August 20, 2008: eTraining Update

The August 20, 2008 version of the ACMAL eTraining Module now contains Specimen Preparation topics, as well as upgrades to the JEOL JSM-6400, Microanalysis, and Support topics.

July 21, 2008: Log AFM Tip Usage

All AFM facility users must log their cantilever tip usage. Review the POLICY on the SPM Overview page.

July 3, 2008: SEM Card Swipe is in Place

All SEM facility users must use the card swipe and automated logging system for the JEOL JSM-6400 SEM as of July 1, 2008. Review the ACCESS INSTRUCTIONS on the SEM facility page.

June 23, 2008: Resources for ACMAL Users and Staff

External resources are available now regarding materials science & engineering, vendors, suppliers, utilities, and web media software solutions.

June 3, 2008: Electron Optics Facility Procedures and Policies, Guest Users

Please visit the policy page for guest users. A list of private consultants has been added. Commercial and non-profit clients have been updated.

May 5, 2008: Education & Research in ACMAL

Facility users may now have their research results posted on the ACMAL website in the new Education & Research page. Submit electronic materials to sehill@mtu.edu.

April 1, 2008: Rapid Communication FAQs Posted

Please visit the ACMAL wiki page for Scientific and Technical FAQs which are posted prior to integration with ACMAL eTraining Modules.

March 25, 2008: Additional Rates Listed

Please visit the ACMAL rates page to see the equipment use rates added for the Atomic Force Microscope and the Auger Microscope.

February 13, 2008: Equipment Status

The Equipment Status page has been moved to an external wiki site for rapid updating.

December 17, 2007: New Rates Listed

Please visit the ACMAL rates page to see the equipment use rates for Dec. 1, 2007 to September 30, 2008.

October 25, 2007: AFM Lab

ACMAL is taking over operation of the Atomic Force Microscopy Lab, located on the 6th floor of the M&M Building.

October 16, 2007: EOF Supplies

Electron Optics Facility users should check the new Electron Optics Facility Supplies page for information about purchasing common supplies needed in the labs.

August 3, 2007: eTraining Update

The August 3, 2007 version of the ACMAL eTraining Module now contains Microanalysis topics, as well as upgrades to the JEOL JSM-6400 and Support topics.

July 12, 2007: Hummer Alert

Use caution working with the Hummer sputter coater. Air dust the target area before coating.

July 12, 2007: New Sample Holder

There is a new 5 position specimen holder for the Hitachi S-4700 FE-SEM.

February 10, 2007: New Rates Listed

Please visit the ACMAL rates page to see the equipment use rates for Oct. 1, 2006 to September 30, 2007

October 16, 2006: New eTraining Modules Available

The first eTraining Module is available for the JEOL JSM-6400 SEM facility.

September 4, 2006: Rietveld Diffraction Analysis

Rietveld diffraction analysis capabilities will be incorporated into the XRD facilities this semester. Ed Laitila will be attending a Rietveld workshop at the International Centre for Diffraction Data on September 27-29 using the GSAS Rietveld software package (freeware) which will be incorporated into our current software capabilities.