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Owen and Ed
  • Owen P. Mills
  • Electron Optics Engineer
  • Materials Science & Engineering
  • Michigan Technological University
  • Room 512, M&M Building
  • Houghton, MI 49931
  • PH 906.369.1875
  • FAX 906.487.2934
  • opmills@mtu.edu

What's New

May 5, 2008: Education & Research in ACMAL

Education and ResearchFacility users may now have their research results posted on the ACMAL website in the new Education & Research page. Submit electronic materials to sehill@mtu.edu.

April 1, 2008: Rapid Communication FAQs Posted

eTrainingPlease visit the ACMAL wiki page for Scientific and Technical FAQs which are posted prior to integration with ACMAL eTraining Modules.

March 25, 2008: Additional Rates Listed

RatesPlease visit the ACMAL rates page to see the equipment use rates added for the Atomic Force Microscope and the Auger Microscope.

February 13, 2008: Equipment Status

The Equipment Status page has been moved to an external wiki site for rapid updating.

December 17, 2007: New Rates Listed

RatesPlease visit the ACMAL rates page to see the equipment use rates for Dec. 1, 2007 to September 30, 2008.

October 25, 2007: AFM Lab

ACMAL is taking over operation of the Atomic Force Microscopy Lab, located on the 6th floor of the M&M Building.

October 16, 2007: EOF Supplies

SuppliesElectron Optics Facility users should check the new Electron Optics Facility Supplies page for information about purchasing common supplies needed in the labs.

August 3, 2007: eTraining Update

The August 3, 2007 version of the ACMAL eTraining Module now contains Microanalysis topics, as well as upgrades to the JEOL JSM-6400 and Support topics.

July 12, 2007: Hummer Alert

Use caution working with the Hummer sputter coater. Air dust the target area before coating.

July 12, 2007: New Sample Holder

There is a new 5 position specimen holder for the Hitachi S-4700 FE-SEM.

February 10, 2007: New Rates Listed

RatesPlease visit the ACMAL rates page to see the equipment use rates for Oct. 1, 2006 to September 30, 2007

October 16, 2006: New eTraining Modules Available

eTrainingThe first eTraining Module is available for the JEOL JSM-6400 SEM facility.

September 4, 2006: Rietveld Diffraction Analysis

Rietveld diffraction analysis capabilities will be incorporated into the XRD facilities this semester. Ed Laitila will be attending a Rietveld workshop at the International Centre for Diffraction Data on September 27-29 using the GSAS Rietveld software package (freeware) which will be incorporated into our current software capabilities.