Hitachi S-4700 FE-SEM Reservations
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Hitachi S-4700 FE-SEM

Location | Capabilities | Training

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on exceptionally clean specimens. It is also suitable for polymeric materials. The S-4700 is configured to detect secondary and backscattered electrons as well as characteristic X-rays. The system is fully automated and is operated via easy-to-use menu driven software.

LOCATION

Room 636, M&M Research Building

Access Type: Card Swipe

CAPABILITIES

Secondary imaging can be carried out at short working distances with an overhead detector or at longer distances with a side-mounted detector and these SE detector signals can be isolated or mixed. Backscatter imaging can be accomplished at accelerating voltages as low as 1 kV at high resolution with the Hitachi-proprietary ExB detector. The menu based Windows software and greater automation will lead to greater ease of use for most individuals.

Energy dispersive analysis is provided via an ultra thin window detector. Analysis of elements from Boron through Uranium is possible with this detection system. It is interfaced with a Gresham Titan Analog HV Power Supply / Pulse Processor and 4Pi Spectral Engine Hardware with DTSA and Revolution Software. Software is available in these packages for X-ray mapping, qualitative, standardless and rigorous standards-based quantitative analysis.

About 4pi: 4pi Analysis, Inc. engineers and sells X-ray Microanalysis and Digital Imaging Systems. Logo used with permission. Disclaimer.

The S-4700 FE-SEM system is interfaced to the campus network so all user data can be downloaded to user storage systems from the laboratory.

TRAINING

eTraining

Courses

Michigan Tech offers many undergraduate and graduate courses related to materials characterization.

One of these courses offers direct, hands-on training in field emission scanning electron microscopy:

MY 5200 - Advanced Scanning Electron Microscopy
Basic design and operating principles of scanning electron microscope (SEM) with discussions on interactions of electrons with solids and resulting signal production, for analysis of heterogeneous materials using X-ray microanalysis, and applications to surface science. Includes practical training on advanced operation of SEM and FE-SEM (FE=field emission)* instruments with an emphasis on the production of high resolution images and quantitative X-ray analysis of specimen composition based on real and virtual standards. (*if available)
Credits: 3.0 Lec-Rec-Lab: (2-0-3) Semesters Offered: Summer
Restrictions: Must be enrolled in one of the following Level(s): Graduate

Last updated February 3, 2010

Disclaimer

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