CAPABILITIES
Secondary imaging can be carried out at short working distances with an overhead detector or at longer distances with a side-mounted detector and these SE detector signals can be isolated or mixed. Backscatter imaging can be accomplished at accelerating voltages as low as 1 kV at high resolution with the Hitachi-proprietary ExB detector. The menu based Windows software and greater automation will lead to greater ease of use for most individuals.
 Energy dispersive analysis is provided via an ultra thin window detector. Analysis of elements from Boron through Uranium is possible with this detection system. It is interfaced with a Gresham Titan Analog HV Power Supply / Pulse Processor and 4Pi Spectral Engine Hardware with DTSA and Revolution Software. Software is available in these packages for X-ray mapping, qualitative, standardless and rigorous standards-based quantitative analysis.
About 4pi: 4pi Analysis, Inc. engineers and sells X-ray Microanalysis and Digital Imaging Systems. Logo used with permission. Disclaimer.
The S-4700 FE-SEM system is interfaced to the campus network so all user data can be downloaded to user storage systems from the laboratory.
Last updated October 15, 2007
Disclaimer
This is to notify you that the material you are accessing is not an official web page of Michigan Technological University, MCFF, or ACMAL. While MTU recognizes the constitutional right of free speech for its University users of the Internet and the World Wide Web, it is not responsible, and hereby disclaims all liability for any data, information, or opinions contained in unofficial web pages. Any comments related to the contents of personal home pages should be directed to the author of the pages. There is no affiliation between ACMAL and JEOL. There is no affiliation between ACMAL and 4pi.
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