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Student using the FE-SEM
  • Owen P. Mills
  • Electron Optics Engineer
  • Materials Science & Engineering
  • Michigan Technological University
  • Room 512, M&M Building
  • Houghton, MI 49931
  • PH 906.369.1875
  • FAX 906.487.2934
  • opmills@mtu.edu

Electron Microscopy
The Electron Optics Facility houses four imaging microscopes.

Electron Microscopy

Electron Optics Facility Overview

Electron beam instrumentation includes two scanning electron microscopes (SEM), a high-resolution transmission electron microscope (TEM) and a focused ion beam milling system (FIB). The Electron Optics Facility (EOF) is overseen by Mr. Owen Mills.

Who Benefits from EOF

  • Faculty
  • Graduate Students
  • Undergraduate Students
  • External Agencies
  • Tour Groups

LOCATION

Sixth Floor, M&M Research Building

Collage Above, Clockwise: ACMAL undergraduate lab assistant Kiersten Schierbeek peers through an optical microscope; the JEOL JEM-4000FX TEM column; computer monitor display of carbon nanotubes; electron beam striking the active area of a multi-phase sample; FE-SEM image courtesy of Michigan Tech Postdoctoral Research Associate Vijaya Kumar Kayastha.

Menu Image, Left: An undergraduate student gets intial exposure to the FE-SEM during a tour of the lab for Fundamentals of Nanoscale Science and Engineering. This class was supported by a grant from the National Science foundation for Nanotechnology Undergraduate Education at Michigan Tech.

Last updated October 15, 2007