eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

Hitachi FB-2000A FIB

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Site Map

ACMAL eTraining

ACMAL eTraining Introduction
How to Use This Module


Specimen Preparation

Introduction

Preparation

Choosing the Preparation Method

Preparing Polished Specimens

Metallurgical

Mount Fabrication Procedure
Steel Etching Procedure
Steel Polishing Procedure

Rocks and Minerals

Thin Sections

Equipment
Procedure

Preparing Unpolished Specimens

Powders

Introduction
Jet Spraying
Lofting
Suspension

Odd Shapes - Fractures
Cryo Fracture Technique

Films

Electronic Materials and Carbon Nanotubes
Multiprep Polishing Procedure

Handling

Coating

Specimen Coating
Reasons for Coating
Metal Coating Procedure
Carbon Coating Procedure

Holders

Introduction
Specimen Holders by Instrument


Leica Ultracut UCT

Overview
Interactive Parts Tour
Operating Procedures


Histology

Overview
Chemicals and Materials

Procedure

Solution Preparation
Explanation of Chemical Calculations for Histology Preparation
Fixation and Dehydration
Mounting

Safety and Disposal
References


JEOL JSM-6400 SEM

Basic Science

Form and Function
Signal Source and Detection

Interactive Parts Tour
Interactive Cutaway Tour
Safety Procedures
Operating Procedures

Imaging Techniques

Basic Imaging
Advanced Imaging

Microanalysis

EDS X-Ray Spectral Analysis
EDS X-Ray Mapping
WDS Quantitative Analysis Procedure
WDS X-Ray Mapping Overview
WDS X-Ray Mapping Procedure

Shut Down
FAQs
Troubleshooting
VIDEO: Specimen Loading Technique
VIDEO: Start Up Technique
VIDEO: Specimen Unloading Technique


Hitachi S-4700 FE-SEM

Basic Science

Form and Function 1
Form and Function 2
Chemical Analysis

Interactive Parts Tour
Interactive Cutaway Tour
Software Tour
Safety Procedures

Operating Procedures

Preliminary
Sample Exchange
Flashing
Imaging
Shut Down

Imaging Techniques

Backscatter Imaging
Charging
Specimen Types

Microanalysis

X-Ray Spectral Analysis
X-Ray Mapping

FAQs

Why Use FESEM?
Specimen Constraints
General FAQs

Troubleshooting


Hitachi FB-2000A FIB

Basic Science

Form and Function: Part 1 - Operation
Form and Function: Part 2

Interactive Parts Tour
Interactive Cutaway Tour
Safety Procedures

Specimen Preparation

Holder Types
Preparation Options

Operating Procedures

Preliminary
Start Up
Specimen Exchange
Alignment
Lift Out Technique
Deposition for Lift Out Technique
Rough Milling for Lift Out Technique
Landing the Probe for Lift Out Technique Part 1
Landing the Probe for Lift Out Technique Part 2
Fine Milling for Lift Out Technique
Tungsten Deposition
Bitmap Image Milling (SEM/TEM)
Using the NPGS Software
Unloading
Shut Down

Imaging Techniques

FIB (Hitachi) Mode
NPGS Mode

FAQs

Troubleshooting

VIDEO: Specimen Loading Technique


Microanalysis

Basic Science

X-Rays and Spectra
Energy Dispersive Spectrometer
Wavelength Dispersive Spectrometer

Safety Procedures
EDS Versus WDS
Quantitative X-Ray Microanalysis

X-Ray Mapping

Basic Science
Interactive X-Ray Mapping Challenge

FAQs
Troubleshooting


Veeco Dimension 3000 Atomic Force Microscope

Overview
Tapping Mode Laser Alignment

Operating Procedures

Preliminary
Alignment
Operation
Image Viewing/Offline Operation
Shut Down


Fluorescence Microscopes

Basic Science

Fluorescence Optical Microscopy
Detection and Visualization

Zeiss AxioVert 200 M and ApoTome

Interactive Parts Tour

Operating Procedures

Start Up
Basic Operation
Fluorescence Microscopy
Shut Down

Tips and Troubleshooting

Olympus BX51 and DP70

Interactive Parts Tour

Operating Procedures

Start Up
Basic Operation
Fluorescence Microscopy
Shut Down

References


Support

System Requirements
Alternative Content
Contact
General Lab Safety
Disclaimers
Usage Permissions
More Resources

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