eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

Hitachi FB-2000A FIB

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Shut Down

Deenergizing Beam

1. On the Control Panel 2, desaturate the filament by slowly decreasing the EMISSION knob. VIEW
2. Turn off high voltage by depressing the ACCEL VOLTAGE button (button light goes out). VIEW

Control Panel Settings

1. On the Control Panel 1 (knobset) depress the SCAN SPEED SLOW button to select slow scan rate. VIEW
2. Depress MEMO key on keyboard. VIEW
3. Use Up/Down arrow on the keyboard to select Shut Down. Press L for Load.    
4. Turn down CRT BRIGHTNESS knob and CRT CONTRAST knob on both CRTs. VIEW
5. Depress PNU2 key on keyboard. VIEW
6. Swipe out of the computer in the same way you logged in.    

Specimen Removal

The procedure is best understood by watching the SEM Specimen Unloading Technique video in JEOL JSM-6400 SEM.

1. Ensure that the EDS detector is in the "out" position. VIEW
2. Find dSpec on the computer screen and select Stage > Home Position to drive the stage to X = 25 and Y = 35. VIEW
3. Check that the stage is set to X = 25 and Y = 25, Tilt = 0, and Working Distance = 39.    
4. Pull the exchange rod into the locked position and place the plexiglass door against the port. Press the vacuum button.    
5. Once the light goes out, open the valve and retrieve the sample.    
6. Retract the sample and close the valve. Release the vacuum. NOTE: Do not touch the exchange rod!    

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