eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

Hitachi FB-2000A FIB

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Why Use FESEM?

The FESEM has many capabilities that extend beyond those of a tungsten filament SEM.

High resolution imaging at low accelerating voltage:

With the tungsten emitter SEM, great skill is required to produce a high resolution image at low voltage. High-resolution images, at high and low voltages, are easily produced with the S-4700 FESEM.

Accelerating voltage can be changed in smaller increments:

The kV can be changed by 1 kV increments on the FESEM, rather than in increments of 5 kV on the tungsten filament SEM. The lowest accelerating voltage the FESEM can achieve is 0.5 kV.

More control of working distance range:

Working distance can be changed in less than 1 mm increments, from 1 mm to 27 mm.

Windows based software makes operation easier because of its more user friendly interface:

Familiarity with Windows operating system software leads to greater productivity, and integrated column controls make switching between operating modes quick and easy. Fewer manual adjustments of the column are required.

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