eTraining Introduction

Specimen Preparation

Leica Ultracut UCT



Hitachi S-4700 FE-SEM

Hitachi FB-2000A FIB


Veeco Dim 3000 AFM

Fluorescence Microscopes




The procedures described anywhere within this eTraining Module do not necessarily apply to similar instrumentation external to ACMAL and Michigan Tech. Procedures and scientific content are provided to the best of our ability. Content revisions are periodic and may not reflect recent upgrades or changes to equipment and software. See the main ACMAL website for additional background information on instruments and for status updates and facility news.

User Accountability

The ACMAL eTraining module does not replace course requirements for authorized usage of equipment. See the main ACMAL website for training certification requirements and other policy. For example, potential users of the JEOL JSM-6400 SEM are required to take either MY4200 Introduction to SEM or MY5200 Advanced SEM AND pass the practical exam.


Always remove your data from the PC. Files are subject to deletion at any time.

External Websites

This is to notify you that the material you are accessing is not an official web page of Michigan Technological University or the ACMAL facility. While MTU recognizes the constitutional right of free speech for its University users of the Internet and the World Wide Web, it is not responsible, and hereby disclaims all liability for any data, information, or opinions contained in unofficial web pages. Any comments related to the contents of personal home pages should be directed to the author of the pages.

There is no affiliation between ACMAL and 4pi.

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