eTraining Introduction

Specimen Preparation

Leica Ultracut UCT



Hitachi S-4700 FE-SEM

Hitachi FB-2000A FIB


Veeco Dim 3000 AFM

Fluorescence Microscopes



Facility Director

Owen MillsOwen P. Mills

Materials Characterization & Fabrication Facilities
Materials Science & Engineering
Michigan Technological University
Room 626, M&M Building
Houghton, MI 49931
PH 906-369-1875
FAX 906-487-2934

Project Collaborator

Susan E. Hill

Web Media Specialist

This website is powered by Adobe Studio CS5 (Dreamweaver, Fireworks, Flash, Flash Builder 4, Media Encoder, Premiere, Acrobat, and Soundbooth), Apple iMovie '09, jQuery UI 1.8.10, Telestream Flip4Mac WMV 2.3.6, Apple QuickTime 10.0, Adobe Captivate, Flesh 2.0 Reading Level Calculator, and Erain Swift 3D 6.0. Swiss Army Image Slideshow is by John Scheuer. The companion equipment status blog and main ACMAL website are Wordpress 3.5.1.

Author Credits

Primary Content Authors

Nils Bergman
Caly Bodeis
Claire Drom
Eric Hackney
Meghan Haycock
Alicia Mikel
Felicia Nip
Kiersten Schierbeek
Mick Small
Owen P. Mills
Susan E. Hill


Michael Boykin
Chuck Herrington
Rod Johnson
Ruth Kramer
Peter McSwiggen
Karl Peterson
Raghav Vanga


Some of the operating procedures were developed by Ruth Kramer, Karl Peterson and Raghav Vanga.


Student Lab Assistants

Room 631, M&M Building

See Electron Optics Facility Staff.


Content Support

Special thanks to Chuck Herrington of Geller MicroÅnalytical Lab, Inc., who reviewed much of the Microanalysis content. Thanks to Dr. Rod Johnson for contributing content on Polishing Rocks and Minerals. Trace element analysis strategy provided by Peter McSwiggen, McSwiggen & Associates, St. Anthony, MN. Thanks to Michael Boykin for reviewing the UCT module.

The interactive cutaway tours for JEOL JSM-6400 SEM and JEOL JEM-4000FX are adapted with permission from diagrams by JEOL USA. The interactive cutaway tour for Hitachi S-4700 FE-SEM is adapted with permission from a diagram by Hitachi, Ltd. Cutaway tours are schematic and provide only salient features.

Financial Support

ACMAL eTraining is funded mainly by Michigan Tech facility users through their research grants.

ACMAL is also grateful to the Michigan Tech Center for Teaching and Learning (formerly the Center for Teaching, Learning, and Faculty Development) for several Mini Grants for Instructional Improvement and Innovation. The purpose of these grants is to improve teaching effectiveness and student learning. These grants are available to support the instructional mission of Michigan Tech:

  • 2012 User Training for Focused Ion Beam and Scanning Auger Microscope
  • 2011 Rich-Content User Training Module for Focused Ion Beam
  • 2009 Continuation of Electron Microscopy Facility User Training Modules
  • 2008 Basic Science Visual Animations for Scanning Electron Microscopy (SEM)

MAKE A GIFT to Michigan Tech ACMAL eTraining.

The modules are available to the global community. ACMAL is operated by the Department of Materials Science and Engineering.

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