eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

Hitachi FB-2000A FIB

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Veeco Dimension 3000 Atomic Force Microscope

AFM Equipment Status

Overview

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension 3000 Atomic Force Microscope operates in both tapping and contact modes, with capabilities of topographic and phase imaging, lateral force microscopy, magnetic force microscopy, and adhesion force mapping. It is also used in measurements of surface and adhesion forces.

It can function in air or liquid, making it useful for biological studies. The sample is placed on a stage which moves in the x, y, and z directions via piezoelectric elements. A cantilever with a microscopic tip moves like a spring over the surface of the sample. A laser beam reflected off the end of the cantilever is recorded on photodiodes, producing an image of the surface topography. Cantilevers vary in size from 3-100 μm with tip radii of 10-30 nm. The size of the tip and flexibility of the cantilever contribute to the high resolution of the image, which can reach 10 pm. The operating modes of the AFM (contact, non-contact, and tapping) and lateral force microscopy allow the user to access a variety of functions of the microscope. In addition to imaging, the AFM can measure the strength of inter-atomic forces and can sense the presence of individual surface atoms.

Veeco Dimension 3000

Veeco Dimension 3000 Atomic Force Microscope

Control Center

Control Center

Specimens

Specimens

Adding a Specimen

Adding a Specimen

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