Philips XL 40 ESEM

Philips XL 40 ESEM
The FEI XL 40 is a tungsten source environmental scanning electron microscope capable of high and low vacuum imaging.


The FEI Philips XL 40 Environmental Scanning Microscope is a large chamber scanning electron microscope capable of imaging hydrated and contaminated samples. Advanced accessories include a thin-window energy dispersive spectrometer (EDS) and hot or cold stages. The system is operated via easy-to-use software control using a Windows user interface. The SEM can be used for organic and inorganic scanning electron analysis.



Room 717, M&M Research Building


The NC/VP Materials Characterization Facility is home to the only environmental scanning electron microscope on campus. The instrument is capable of operating in low or high vacuum modes, includes EDAX EDS and both high (1,000 C) and low temperature stages. The large chamber accommodates a variety of specimens and the low vacuum environment can be operated with water vapor or another gas depending upon the requirements of the characterization to be performed.



Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Available topics related to this instrument:

Specimen Preparation Online Training User Support for Online Training


Michigan Tech offers many undergraduate and graduate courses related to materials characterization.

One of these courses offers direct, hands-on training in scanning electron microscopy:

MY 4200 – Introduction to Scanning Electron Microscopy
Introduction to scanning electron microscope (SEM) theory and application. Topics will include electron beam and image formation, beam-specimen interactions, and x-ray microanalysis. Course material will be of interest to biologists, chemists, and engineers. Completion of MY4201 is required for independent use of the equipment.
Credits: 2.0
Lec-Rec-Lab: (2-0-0)
Semesters Offered: Fall
Restrictions: May not be enrolled in one of the following Class(es): Freshman, Sophomore




Protocols for sample preparation analysis and operation are available in this community wiki environment. You are invited to contribute your relevant methods to this wiki by creating your own login account.

Last updated March 4, 2015