The FEI Philips XL 40 Environmental Scanning Microscope is a large chamber scanning electron microscope capable of imaging hydrated and contaminated samples. Advanced accessories include a thin-window energy dispersive spectrometer (EDS) and hot or cold stages. The system is operated via easy-to-use software control using a Windows user interface. The SEM can be used for organic and inorganic scanning electron analysis.
Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.
Available topics related to this instrument:
Michigan Tech offers many undergraduate and graduate courses related to materials characterization.
One of these courses offers direct, hands-on training in scanning electron microscopy:
MY 4200 – Introduction to Scanning Electron Microscopy
Introduction to scanning electron microscope (SEM) theory and application. Topics will include electron beam and image formation, beam-specimen interactions, and x-ray microanalysis. Course material will be of interest to biologists, chemists, and engineers. Completion of MY4201 is required for independent use of the equipment.
Semesters Offered: Fall
Restrictions: May not be enrolled in one of the following Class(es): Freshman, Sophomore
Last updated March 4, 2015