The JEOL JEM-2010 is a high resolution transmission electron microscope that can be operated between 80 and 200 kV accelerating voltage. The JEM-2010 is configured with a high brightness LaB6 source for convergent and nano beam electron diffraction. The instrument is configured with several useful accessories, including a Gatan Orius SC200 high-speed digital camera and an Oxford energy dispersive spectrometer/4pi workstation. Together, these systems permit advanced microstructural and compositional studies of a wide variety of organic and inorganic materials.
Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.
Available topics related to this instrument:
Michigan Tech offers many undergraduate and graduate courses related to materials characterization.
One of these courses offers direct, hands-on training in transmission electron microscopy:
MY 5250 – Transmission Electron Microscopy
Practical aspects of materials characterization by transmission electron microscopy.
Semesters Offered: On Demand
Restrictions: Must be enrolled in one of the following Level(s): Graduate
Last updated May 13, 2014