JEOL JEM-2010 TEM

JEOL JEM-2010 TEM
The JEOL JEM-2010 TEM is a high resolution transmission electron microscope.

Overview

The JEOL JEM-2010 is a high resolution transmission electron microscope that can be operated between 80 and 200 kV accelerating voltage. The JEM-2010 is configured with a high brightness LaB6 source for convergent and nano beam electron diffraction. The instrument is configured with several useful accessories, including a Gatan Orius SC200 high-speed digital camera and an Oxford energy dispersive spectrometer/4pi workstation. Together, these systems permit advanced microstructural and compositional studies of a wide variety of organic and inorganic materials.

Reservations

TEM Calendar

IMPORTANT: Please remember to add the ACCELERATING VOLTAGE to your calendar reservations.

TEM Equipment Status

Location

Room 634, M&M Research Building

Training

eTraining

Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Available topics related to this instrument:

Specimen Preparation Online Training Leica Ultracut UCT Online Training User Support for Online Training

Courses

Michigan Tech offers many undergraduate and graduate courses related to materials characterization.

One of these courses offers direct, hands-on training in transmission electron microscopy:

MY 5250 – Transmission Electron Microscopy
Practical aspects of materials characterization by transmission electron microscopy.
Credits: 3.0
Lec-Rec-Lab: (2-0-3)
Semesters Offered: On Demand
Restrictions: Must be enrolled in one of the following Level(s): Graduate

Resources

Last updated May 13, 2014