Hitachi S-4700 FE-SEM

Hitachi S-4700 FE-SEM
The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope.


The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on exceptionally clean specimens. It is also suitable for polymeric materials. The S-4700 is configured to detect secondary and backscattered electrons as well as characteristic X-rays. The system is fully automated and is operated via easy-to-use menu driven software.



Room 636, M&M Research Building


Secondary imaging can be carried out at short working distances with an overhead detector or at longer distances with a side-mounted detector and these SE detector signals can be isolated or mixed. Backscatter imaging can be accomplished at accelerating voltages as low as 1 kV at high resolution with the Hitachi-proprietary ExB detector. The menu based Windows software and greater automation will lead to greater ease of use for most individuals.

4piEnergy dispersive analysis is provided via an ultra thin window detector. Analysis of elements from Boron through Uranium is possible with this detection system. It is interfaced with a Gresham Titan Analog HV Power Supply / Pulse Processor and 4Pi Spectral Engine Hardware with DTSA and Revolution Software. Software is available in these packages for X-ray mapping, qualitative, standardless and rigorous standards-based quantitative analysis.

About 4pi: 4pi Analysis, Inc. engineers and sells X-ray Microanalysis and Digital Imaging Systems. Logo used with permission. See disclaimer below. (NOTE: 4pi has ceased manufacturing and sales. ACMAL is confident that this will not affect 4pi’s ability to provide technical support to this lab. There is no formal affiliation between 4pi and ACMAL.)

The S-4700 FE-SEM system is interfaced to the campus network so all user data can be downloaded to user storage systems from the laboratory.

This is to notify you that the material you are accessing is not an official web page of Michigan Technological University, MCFF, or ACMAL. While MTU recognizes the constitutional right of free speech for its University users of the Internet and the World Wide Web, it is not responsible, and hereby disclaims all liability for any data, information, or opinions contained in unofficial web pages. Any comments related to the contents of personal home pages should be directed to the author of the pages. There is no affiliation between ACMAL and Hitachi. There is no affiliation between ACMAL and 4pi.



Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Available topics related to this instrument:

Specimen Preparation Online Training Hitachi S-4700 FE-SEM Online Training User Support for Online Training


Michigan Tech offers many undergraduate and graduate courses related to materials characterization.


Last updated May 6, 2014