Electron Microscopy

Electron Optics Facility Overview

Electron beam instrumentation includes two scanning electron microscopes (SEM), a high-resolution transmission electron microscope (TEM) and a focused ion beam milling system (FIB). The Electron Optics Facility (EOF) is overseen by Mr. Owen Mills.

Who Benefits from EOF

Graduate Students
Undergraduate Students
External Agencies
Tour Groups

Hitachi S-4700 FE-SEM Hitachi FB-2000A FIB JEOL JSM-6400 SEM JEOL JSM-2010 TEM FEI 200kV Titan Themis S-TEM Philips XL 40 ESEM


  • Sixth Floor, M&M Research Building
    Michigan Tech Main Campus
  • Advanced Technology Development Complex (ATDC, west end)
    1402 Sharon Avenue
    Houghton, MI
    Across the parking lot from the Seaman Mineral Museum.