Electron Microscopy

Electron Optics Facility Overview

Electron beam instrumentation includes two scanning electron microscopes (SEM), a high-resolution transmission electron microscope (TEM) and a focused ion beam milling system (FIB). The Electron Optics Facility (EOF) is overseen by Mr. Owen Mills.

Who Benefits from EOF

Faculty
Graduate Students
Undergraduate Students
External Agencies
Tour Groups

Hitachi S-4700 FE-SEM Hitachi FB-2000A FIB JEOL JSM-6400 SEM JEOL JSM-2010 TEM FEI 200kV Titan Themis S-TEM Philips XL 40 ESEM

Location

  • Sixth Floor, M&M Research Building
    Michigan Tech Main Campus
  • Advanced Technology Development Complex (ATDC, west end)
    1402 Sharon Avenue
    Houghton, MI
    Across the parking lot from the Seaman Mineral Museum.