SYSTEM REQUIREMENTS
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- Audio
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MODULE AUTHORS
See Electron Microscopy Contact under Support.
ADDITIONAL TRAINING DOCUMENTS
See Also: ACMAL Wiki FAQs for rapid updates.
JEOL JEM-4000FX TEM
Description of Control Panels (PDF)
Added January 26, 2009
ADDENDUM added January 5, 2009:
SEM EDS Tips for dQant32, dSspec, dPict32, and Spectrometer (PDF)
Sample Preparation: Cleaning the Multiprep
Sample Preparation: How can I avoid destroying the ultrasonic cleaner?
COMMUNITY
Recommended
Posted January 23, 2009
Microscopy Society of America (MSA)
MSA Listserver
“For the purposes of this discussion forum, Microscopy or Microanalysis should be considered to include all techniques which employ a probe such as: photons (including x-rays), electrons, ions, mechanical and/or electromagnetic radiation to form a representation or characterization of the microstructure (internal or external) of any material in either physical and/or life sciences applications.”
EFUG: European Focused Ion Beam Users Group
Publication
Posted December 9, 2008
K Schierbeek, SE Hill and OP Mills (2008). Electronic Training Resource for Higher Education. Microscopy and Microanalysis, 14 (Suppl. 2) , pp 86-87 doi:10.1017/S143192760808536X
Invited Paper
Advances in Instrumentation and Techniques - Teaching Microscopy and Microanalysis
Published online by Cambridge University Press 03 Aug 2008
Posted November 18, 2008

Owen Mills spoke about "Using Rich Content for Microscopy Training" to other faculty and staff at Michigan Tech, while web media specialist Sue Hill demonstrated the interactive media used in eTraining modules.
Microscopy and Microanalysis Meeting 2008

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ACMAL staff attended the recent Microscopy and Microanalysis Meeting 2008 in Albuquerque, New Mexico. The conference was attended by Owen Mills, Kiersten Schierbeek, and staff alumnus Alicia Mikel. They presented the poster "Electronic Training Resource for Higher Education", based on the ACMAL eTraining Modules developed for facility users. Staff were able to discuss potential collaborations with such vendors as Hitachi and organizations like Microscopy Today. Left image: Alicia and Kiersten discuss their work with an interested attendee. Right image: Alicia (left) and Kiersten (right) also brought a laptop to demonstrate the scope and functionality of the module.
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TROUBLESHOOTING
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Last updated
August 4, 2011
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