CAPABILITIES
 Imaging modes include transmitted, diffracted, scanning transmitted, secondary, and backscattered electron as well as X-rays. Under ideal conditions, point to point resolution in transmission mode is 0.2 nm - lattice resolution is 0.14 nm. Secondary electron resolution is 2-3 nm. Probe diameter is 1.0 nm (nominal). Transmitted and diffracted electron images can be recorded with the plate camera on photographic sheet film. Scanning electron images are recorded on either Polaroid film or by digital image capture through the Gatan system with subsequent output to a file or laser printer.
Structural investigations can be made with this instrument using transmitted and diffracted electrons. The analyst uses bright field images of specially thinned specimens to select areas for crystallographic study using diffracted electrons. The ability to tilt a specimen in two directions permits indentification of crystalline orientations.
Specialized holders for the goniometer stage include Gatan heating-strain stage and double-tilt.
 X-ray microanalysis may be employed to gain compositional information. Characteristic X-rays can be detected from ~1 cubic nm volume of the specimen. Qualititative analysis, determination of presence or absence of a particular element, is routinely accomplished using menu driven software. Elements from atomic number 11 (Na) to 92 (U) can be detected in concentrations above 0.1 wt% element. Accurate quantitative analysis can be attained using real or standardless modes.
About JEOL: JEOL USA is a leading supplier of scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes. Logo used with permission. Disclaimer.
About 4pi: 4pi Analysis, Inc. engineers and sells X-ray Microanalysis and Digital Imaging Systems. Logo used with permission. Disclaimer.
TRAINING
Courses
Michigan Tech offers many undergraduate and graduate courses related to materials characterization.
One of these courses offers direct, hands-on training in transmission electron microscopy:
 MY 5250 - Transmission Electron Microscopy
Practical aspects of materials characterization by transmission electron microscopy.
Credits: 3.0 Lec-Rec-Lab: (2-0-3) Semesters Offered: On Demand
Restrictions: Must be enrolled in one of the following Level(s): Graduate
Last updated October 15, 2007
Disclaimer
This is to notify you that the material you are accessing is not an official web page of Michigan Technological University, MCFF, or ACMAL. While MTU recognizes the constitutional right of free speech for its University users of the Internet and the World Wide Web, it is not responsible, and hereby disclaims all liability for any data, information, or opinions contained in unofficial web pages. Any comments related to the contents of personal home pages should be directed to the author of the pages. There is no affiliation between ACMAL and JEOL. There is no affiliation between ACMAL and 4pi.
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