New PHI 5800 XPS for Surface Analysis

CH 5660/MY5660—Surface Science and Spectroscopy Course Syllabus
College of Science and Arts/College of Engineering
Fall 2017

A newly acquired PHI 5800 X-ray photoelectron spectrometer (XPS) adds to the surface analysis capabilities of ACMAL. The PHI 5800 XPS is equipped with a dual source anode (Al and Mg), a hemispherical analyzer, for XPS and AES analysis, including elemental mapping capabilities, an electron gun source for AES analysis, an ion sputter gun for depth profiling, and stage tilting for angle-resolved XPS.

The XPS was generously donated by the Army Research Laboratories with help from the Department of Chemistry at Michigan Tech.