Archives by date

You are browsing the site archives for November 2016.

PHI 5800 XPS

New PHI 5800 XPS for Surface Analysis

A newly acquired PHI 5800 X-ray photoelectron spectrometer (XPS) adds to the surface analysis capabilities of ACMAL. The PHI 5800 XPS is equipped with a dual source anode (Al and Mg), a hemispherical analyzer, for XPS and AES analysis, including elemental mapping capabilities, an electron gun source for AES analysis, an ion sputter gun for […]