New 200kV Titan Themis Scanning Transmission Electron Microscope

FEI Titan Themis STEM
FEI 200kV Titan Themis Scanning Transmission Electron Microscope

Michigan Tech has entered into a purchase agreement with electron microscope manufacturer FEI to procure their 200kV Titan Themis Scanning Transmission Electron Microscope. The electron microscope is configured with two aberration correctors making it capable of 80 picometer image resolution. This is true atomic resolution.

Important options include the Super X four spectrometer x-ray analysis system for extremely fast x-ray mapping, the Velox high-speed 14 megapixel camera and a Gatan energy filter/electron energy loss spectrometer (GIF/EELS).

Also included are five specialized specimen holders including MEMs, electrochemistry, electrical probing, tomography and nano-indenter holders. Michigan Tech researchers are working now to locate appropriate space for the installation site, a process that will likely include construction of a specialized building. The microscope will be delivered in December 2015.